SWTW 2007 - Call for Participation

CALL FOR PARTICIPATION

Program Overview -- Advance Program -- Social Activities -- Registration & Reservations -- Expo 2007 -- Contacts

Program Overview

The 17th annual SW Test Workshop is the only IEEE-sponsored conference that focuses on all aspects of semiconductor wafer and die level probe testing. The workshop begins Sunday afternoon, June 3, with a tutorial and two presentations that discuss aspects of Probe Card Cleaning, followed by a welcome reception, dinner, and a Keynote Speaker. The Technical Program begins Monday morning with 30-minute presentations in theme-oriented sessions. Advanced registration is $625 for IEEE members and $660 for non-members, and includes all meals, refreshments, social activities, and conference and exhibit attendance, as well as the printed Proceedings distributed at the Workshop. The workshop concludes Wednesday at Noon, June 6, after the awards presentation and luncheon. To receive the advance registration discount, register online at:

www.swtest.org

or print a copy of the registration form and FAX it to the office by May 25, 2007. On site registration will be $725 for members and $760 for non-members.

Keynote Address: Vikas Sharma, Intel Wafer Test Manager, Sort Test Technology Development, will present the Keynote Address on Sunday evening after dinner. He will discuss the significant test cost reductions Intel has achieved over the past few years by working very closely with their key equipment suppliers. These include the use of new test strategies, DFT on the chips, and new test technology developments by extensive cooperation with their Automatic Test Equipment and Test Tooling suppliers.

Technical Program Sessions:

Probe “Year in Review”	Advanced Probe Card Technologies
Probe to Pad Contact Mechanisms	RF Probing
Controlling Pad Damage	Probe Potpourri
Strategic Design Methodologies	Probe Interfaces and Connectivity
Large Area Array Probing	Probe Challenges

The schedule and session titles are subject to change without notice.

Program Overview Flyer in pdf format is available for download and distribution at:

SWTW - 2007 General Sessions Overview

Advance Program

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Sunday -- Monday -- Tuesday -- Wednesday

June 3 , 2007 (Sunday)

2:00 PM - 3:30 PM	Tutorial
2:00 - 3:30	Probe Card Cleaning Tutorial Gene Humphrey, Jerry Broz, Ph. D., and Wayne Fitzgerald - International Test Solutions

3:30 PM - 4:00 PM BREAK

4:00 PM - 5:00 PM	On-line Cleaning Application
4:00 - 4:30	Online Semi-radius Probe Tip Cleaning and Reshaping Sam McKnight, Michael Agbesi - IBM
4:30 - 5:00	Probe Tip Clean on Demand Rob Marcelis - Salland Engineering

5:00 PM - 7:00 PM REGISTRATION & RECEPTION

7:00 PM - 8:15 PM BUFFET DINNER

8:15 PM - 9:45 PM	Evening Session
8:15 - 900	*PROBE YEAR IN REVIEW* Bill Mann and Roger Sinsheimer
9:00 - 9:45	*KEYNOTE* Vikas Sharma - Intel, Wafer Test Manager Sort Test Technology Development

9:45 PM BAREFOOT BAR NETWORKING

June 4, 2007 (Monday)

7:00 AM - 8:00 AM REGISTRATION & CONTINENTAL BREAKFAST

8:00 AM - 8:30 AM	Welcome
8:00 - 8:30	Welcome to SWTW-2007 Jerry Broz, Bill Mann

8:30 AM - 10:00 AM	Probe to Pad Contact Mechanisms
8:30 - 9:00	Probe Mark Inspection As Part Of Quality and Reliability Tests In Automotive Devices A. Garcia - Texas Instruments; T. Weiss, U. Efrat, I. Grimberg - Camtek
9:00 - 9:30	Effect of Different Wafer Pad Metallizations on ViProbe® Scrub Marks Dr.-Ing,. Sylvia Ehrler - Feinmetall
9:30 - 10:00	Electrical Contact Resistance - The Key Parameter in Probe Card Performance January Kister Ph. D., Steve Hopkins - Microprobe

10:00 AM - 10:30 AM BREAK

10:30 AM - 12:00 PM	Controlling Pad Damage
10:30 - 11:00	Wafer Probing Scrub Analysis to Optimize KGD Applications Ying Wang, Rod Martens, Sunil Wijeyesekera, Ken Matsubayashi, Tom Napier, Amy Leong - FormFactor
11:00 - 11:30	Control of Pad Damage Using Prober Operational Parameters Jerry Broz, Ph. D. - International Test Solutions; A. Edward Robinson, Ph. D. - Hyphenated Systems; Deborah Miller - Micron
11:30 - 12:00	Closing the Loop: Incorporation of Sort Floor Data to Improve Probe Card Performance John Strom - Applied Precision; Greg Buck, Tom Ashworth - Micron

12:00 NOON - 1:00 PM LUNCH

1:00 PM - 3:00 PM	Strategic Design Methodologies
1:00 - 1:30	New Pathfinding and Supplier Investigation Strategy Roy Swart, Ethan Caughey - Intel
1:30 - 2:00	Globalization and its Impact on Probing Process Alan Romreill - Spansion; Amy Leong - FormFactor
2:00 - 2:30	Probe Card Metrology: 'Getting The Right Answers By Asking The Right Questions' Vincent Cruvellier - Freescale; Rex Sandbach - Applied Precision
2:30 - 3:00	Measuring Z-accuracy over a Broad Temperature Range using a Force Sensor Sancho Adam - Electroglas

3:00 PM - 3:30 PM BREAK

3:30 PM - 5:00 PM	Large Area Array Probing
3:30 - 4:00	A New Dimension in Probe Count: 27k Probes Michael Huebner - FormFactor
4:00 - 4:30	Reinforcement of PCB using Advanced Stiffeners for High Pin Count Devices Nicolas Salles, Rehan Kazmi, Ph. D., - SV Probe Technology; Wayne Nelson - Reid-Ashman Manufacturing
4:30 - 5:00	Challenges in Testing High Force 300mm Probe Card Arrays Rod Schwartz, Mark McLaren - Integrated Technology Corporation

5:00 PM - 6:00 PM PARADISE BALLROOM FOYER RECEPTION

6:00 PM - 9:00 PM	EXHIBITS OPEN
6:00 PM - 9:00 PM CARVING STATION DINNER

9:00 PM BAREFOOT BAR - PROBE ENGINEER PENTATHALON

June 5 , 2007 (Tuesday)

7:00 AM - 8:00 AM CONTINENTAL BREAKFAST

8:00 AM - 10:00 AM	Advanced Probe Card Technologies
8:00 - 8:30	Revolutionary Changes in C4 Wafer Test Probe Card Technologies Ethan Caughey, Roy Swart - Intel
8:30 - 9:00	Advanced Probe Card Technology Enables expanding Specialty Memory Wafer Test Requirements Andrei Berar, F. C. Chong, Eric Chieh - NanoNexus
9:00 - 9:30	3D-MEMS Probe for Fine Pitch Probing Ryuichiro Mori - Japan Electric Materials Corp.
9:30 - 10:00	Hybrid Wafer Testing Probe Card Brian Moore, Chris Sellathamby, Jeff Hintzke, Steve Slupski - Scanimetrics

10:00 AM - 10:30 AM BREAK

10:30 AM - 12:00 PM	RF Probing
10:30 - 11:00	Multi-site Probing for Consumer RF Applications Jeff Arasmith, Roger Hayward - Cascade Microtech
11:00 - 11:30	Advanced Probecard Architecture for Lower-cost RF Wafer Testing Jeff Hintzke, Brian Moore, Chris Sellathamby, Steve Slupsky - Scanimetrics
11:30 - 12:00	Probe Card Characterization in Time and Frequency Domain Gert Hohenwarter - GateWave Northern, Inc.

12:00 NOON - 1:00 PM LUNCH Paradise Lawn (BBQ)

1:00 PM - 3:00 PM	Probe Potpourri
1:00 - 1:30	ISMI Probe Council Probe Specification Guidelines and Cost of Ownership Jack Courtney - IBM; Stu Crippen - Intel; Jens Kober - AMD
1:30 - 2:00	Challenges of Vertical Probing for the 48 Core 11K+ Bump Count Vega2 Processor Tony Altinis, Janet Wu, Samy Makar - Azul Systems; Bob Rogers - Wentworth
2:00 - 2:30	ROUTE60TM : A New vertical Probing Technology Roberto Crippa, Stefano Lazzari - Techniprobe; Raffaele Vallauri, Massimo Gervasoni - STMicroelectronics
2:30 - 3:00	Low Yield Response in High Volume Production Al Wegleitner - Texas Instruments

3:00 PM - 3:30 PM BREAK

3:30 PM - 5:30 PM	EXHIBITS OPEN + POSTER SESSION
3:30 - 5:30	Sodas and Cookies

6:00 PM - 10:00 PM	SEA WORLD DINNER
6:00 - 10:00	Reception, Dinner, Seal and Shamu Show BUSSES DEPART FOR SEA WORLD AT 6:00PM

June 6 , 2007 (Wednesday)

7:00 AM - 8:00 AM CONTINENTAL BREAKFAST

8:00 AM - 10:00 AM	Probe Interfaces and Connectivity
8:00 - 8:30	Theory and Test Methods for Board-to-Board Interposer Technologies Roger Sinsheimer - Xandex
8:30 - 9:00	Thin Film Interposer Probes in Production Chris Sullivan, John Hagios - IBM
9:00 - 9:30	Stud Bump Technology for Space Transformer Lifetime Improvement on Cobra Probe Card William Palcisko, Isabelle Garidi, Ph. D. - SV Probe; Christian Degen, Ph. D. - Infineon
9:30 - 10:00	WSP- Cost Effective Wafer Scale Probing of WLCSP Wafer Level Chip Scale Package Norman J. Armendarez - Texas Instruments

10:00 AM - 10:30 AM BREAK

10:30 AM - 12:00 PM	Probe Challenges
10:30 - 11:00	Parallel Sort Process and its Challenges on CMT Platform Roy Sabita - Intel
11:00 - 11:30	The Influences of Signal Matching During Parallel Multi-site Testing Al Wegleitner - Texas Instruments
11:30 - 12:00	Taguchi's Method Applied to Probe Card Development Vincent Reynaud - Mesatronics

12:00 NOON - 1:00 PM AWARDS and FAREWELL LUNCHEON

Social Activities

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SWTW is a probe technology forum with a relaxed atmosphere held at a beautiful resort hotel and has ample time dedicated to informal discussions and networking. This year’s special social activities include an exclusive trip to Sea World with a private reception, dinner, and Seal and Shamu Shows. Busses will depart from the hotel at 6:00 PM Tuesday and return attendees by 10:00 PM.

Additional social activities include: three receptions, and a fun Probe Test Pentathlon at the hotel's Barefoot Bar after the exhibits close on Monday night.

Registration & Reservations

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Online Registration
On-line registration for the Semiconductor Wafer Test Workshop will be available through midnight Eastern Time on Monday, May 21, 2007. To make your online reservation please go to:

SWTW 2007 Online Registration

Rates

SWTW 2007 Registration Fees	IEEE/CS Members	Non-Members
Advance Rates	$625	$660
On-Site (after May 21 - at hotel)	$725	$760

Hotel Reservations
Contact the Paradise Point Resort and Spa at (800) 344-2626 or via the room reservations web site link to get a discount rate of $179 per night. When placing your reservation by phone reference SWTW 2007. Contact the SWTW office at +1.540.937.5066 for alternate hotels.

SWTW 2007 Online Reservations

Expo 2007

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Exhibits (EXPO - 2007): Forty of the top probe card, probe equipment, and related service suppliers will exhibit the latest products. EXPO viewing hours do not compete with the Technical Program. The EXPO will be open for three hours on Monday evening, June 4, and will include a variety of carving stations for dinner. The EXPO will be open for two hours on Tuesday afternoon, June 5, and will include afternoon refreshments. It’s the only conference where ALL the top probe and probe-related suppliers are in one place at one time.

Contact

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For more information, please contact either:

Dr. Jerry Broz
International Test Solutions
General Chairman
jerry.broz@swtest.org

Brett Crump
Micron Technology, Inc.
Program Chair
bcrump@micron.com

William Mann
Chairman Emeritus
william.mann@ieee.org

For more information, visit us on the web at: http://www.swtest.org

The SW Test Workshop (SWTW 2007) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).